SOLUTION SET: Crystalline PV Wafer Inspection Automation

New inspection and metrology technologies are increasingly being adopted to support aggressive goals for improving efficiency and yield. Successfully integrating these test methods into high volume manufacturing requires automation platforms that meet in-line throughput, factory automation, and damage requirements.

Automation Platform
The Owens c-Si Inspection Automation Platform provides high speed, high reliability handling in customizable configurations to meet advanced factory automation requirements. Input load modules can be configured for either cassette or coin stack input. The output sorter module can be expanded from 6 to 18 bins by daisy chaining up to 3 modules inline.

Inspection/Metrology
Owens will integrate inspection and metrology systems to meet your test requirements. These can be of your own design or a third party product you specify. Owens will develop the necessary electro-mechanical and software interfaces to integrate the measurement modules seamlessly with the automation platform.

Owens’ Solutions
Owens has built an outstanding reputation for the collaborative development of complex, production ready advanced technology equipment over our 25 year history.

Our in-depth experience providing high speed solar handling solutions can help make your next technology introduction a greater success.