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Semiconductor Industry

Articles: Current

02/01/2010  :  Faulty logic in production tool development will lead to poor results
12/22/2008  :  Decoupling Platform and Tool Development
09/23/2008  :  Collaborative Design/Manufacturing Approach critical to Metrosol VUV Metrology Development
06/01/2008  :  Automating Solar Energy
06/17/2007  :  FAB MANAGEMENT: A revolution is needed…
05/23/2007  :  Diagnosis of Image Noise Using Mathcad
09/12/2006  :  Preparing for a Downturn: Three Steps Engineering Can Take Today
05/25/2006  :  Solving the resource dilemma
04/28/2006  :  Metrology and Inspection Tool Platform Solution
03/20/2006  :  Crisis in R&D Spending
03/20/2006  :  Reducing Tool Platform Costs: A Case Study
11/07/2005  :  How to Reduce Design Cost—A Contrarian View
11/07/2005  :  ATE Calibration Robots: Driving Down Measurement Error
08/08/2005  :  Learning from experience: Leading collaborative development programs
08/08/2005  :  Taking advantage of the SEMI BOLTS-M interface
08/08/2005  :  The art of reducing product development times
04/19/2005  :  Why we “insist” on manufacturing our designs
04/18/2005  :  Engaging the Hidden Customer
04/15/2005  :  Offshoring—an actual cost comparison
01/17/2005  :  Personality-Oriented Approach Improves NPD Results
01/17/2005  :  Hard Disk Solution Sets: Addressing Emerging Requirements
01/17/2005  :  Market Requirement Statement: Missing the Mark
12/07/2004  :  Collaborative Product Development
12/07/2004  :  The Risk of Talking About Risk
12/07/2004  :  Balancing Act
07/10/2004  :  Outsourcing for Design Engineering & Manufacturing
04/01/2004  :  Dual Sided Wafer Metrology for MEMS Applications
10/03/2003  :  Owens Design Collaborates with Candela Instruments
09/01/2003  :  Rapid Development of Metrology Automation
05/01/2001  :  Owens Design Makes Picture Perfect DVDs
12/01/2000  :  Outsourcing for the OEM